GATR™ The GATR™ grazing angle ATR accessory is a revolutionary approach to the analysis of monolayers on semiconductor and metallic substrates by FT-IR spectroscopy. The GATR™ is optimized for high sensitivity to these types of samples. Its specially designed pressure applicator is optimized for delivering good contact between the sample and the Ge ATR crystal. This configuration provides at least an order of magnitude increase in sensitivity relative to grazing angle methods, along with the convenience of an easy to use, fully prealigned, horizontal sampling accessory (HATR). Applications Analysis of monolayers on metals and monolayers on silicon by FT-IR ATR spectroscopy. Measurements of adsorbed species on semiconductors adsorbed species on metals. Spectroscopy analysis of thin photoresists. Rapid, repeatable measurements, ideal for laboratory and QC applications. Includes Ge hemispherical ATR crystal. Built-in pressure applicator, designed to accommodate small and large samples. Mounting hardware for the specified FT-IR spectrometer. Features Convenient horizontal ATR sampling surface (HATR). Built-in pressure applicator optimized for contact with hard samples. Sampling stage accommodates wafers up to 6" in diameter for whole-surface analysis. 65° fixed incident angle. Accommodates samples up to 8" in diameter with center-sampling of discs up to 6" in diameter. Ge ATR crystal. PermaPurge™ for rapid purging of the FT-IR system. Options available: Wire grid polarizer (KRS-5 substrate) for enhanced spectral contrast and orientation studies. Includes slide plate mount. Fixed torque Slip-Clutch to apply repeatable ATR contact pressures to solid samples. Torque Screwdriver to apply your choice of contact pressure for repeatable ATR spectroscopy measurements of solid samples. Ordering Information Catalog No. GATR™ GATR-XXX XXX denotes the FT-IR spectrometer code Options And Replacements Parts GATR™ Wire Grid Polarizer (KRS-5 Substrate). Includes mount and polarizer. PWD-GATR-XXX GATR™ Wire Grid Polarizer Mount. Compatible with the PWD Wire Grid Polarizers. PWC-GATR-XXX GATR Pads (pack of five) GATR-PAD SLP-CHI Torque Screwdriver PTW-SXX Mounted Ge ATR Crystal GATR-ATR-J Internal Reflection Spectroscopy IRS-671 Internal Reflection Spectroscopy: Review and Supplement IRS-RS1 The GATR™ is a single reflection ATR accessory designed for analyzing monolayers and adsorbed species on semiconductor and metallic substrates. The GATR™ integrates the theoretical conditions that provide the highest sensitivity to these extremely thin films, in a convenient horizontal ATR sampler (HATR). The GATR™ features a 65° incident angle and a Ge ATR crystal for use from 5000 to 650 cm-1. Its specially designed pressure applicator optimizes contact between the sample and the relatively small active portion of the crystal. For greater sensitivity, a wire grid polarizer can be added to the GATR™ and, for repeatable FT-IR spectroscopy measurements. In addition, a slip-clutch or torque screwdriver can be used for reproducible and consistent contact. Figure 1. ATR Spectrum of an Organic Monolayer on Silicon. Figure 2. ATR Spectrum of an Organic Monolayer on Gold. Figures 1 and 2 demonstrate the high sensitivity of the GATR™ to monolayers. Figure 1 is a spectrum of an organic monolayer on a polished silicon surface. Figure 2 shows the spectrum of a monolayer on a gold-coated glass substrate. For sampling versatility, the GATR™ can also be used to analyze liquids, powders, pastes, and other solids by FT-IR ATR spectroscopy. It is especially useful for samples with intense spectral bands. Such samples might otherwise exhibit too high absorbance or band distortions.